This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.
Beilstein J. Nanotechnol. 2018, 9, 1146–1155, doi:10.3762/bjnano.9.106
Figure 1: Characterizing the degree of reduction of GO sheets reduced using various methods. C 1s XPS spectra...
Figure 2: Characterizing the degree of reduction of GO sheets using EFM imaging and EFS: (a) tapping AFM imag...
Figure 3: Illustrative diagram of EFM imaging and EFS: (a) schematic depiction of EFM, (b) electrostatic forc...
Beilstein J. Nanotechnol. 2018, 9, 900–906, doi:10.3762/bjnano.9.84
Figure 1: Schematic representation of the experimental principle. (a) A dc voltage can be applied to the AFM ...
Figure 2: AFM height and adhesion images of single-layered CRGO sheets under different tip biases obtained in...
Figure 3: Discrimination of GO and CRGO on mica by adhesion mapping with a biased AFM tip. (a) Height and (b)...
Figure 4: The dependence of the adhesion force on the AFM tip bias for three types of single-layered GO and R...